CityU Institutional Repository >
4_Student Final Year Projects >
Applied Social Sciences - Postgraduate Diploma Papers - Psychology >
Please use this identifier to cite or link to this item:
|Title: ||The effects of self-esteem, parental attachment, peer influence on deviant behavior among Hong Kong adolescents|
|Authors: ||Chan, Mei Fung|
|Department: ||Department of Applied Social Studies|
|Discipline: ||Social Psychology|
|Issue Date: ||2004|
|Supervisor: ||Dr. Cheng Christopher Hon Kwong|
|Abstract: ||Objectives: The present study investigated the effects of self-esteem, parental attachment, and peer influence on deviant behavior among Hong Kong adolescents.
Methods: A total of 421 students from secondary school Form 2 to Form 4 (244 boys and 169 girls) completed a questionnaire consisting of 4 scales: the Chinese Adolescent Self-Esteem Scales (CAESE), the Inventory of Parent and Peer Attachment (IPPA), the Susceptibility to Peer Pressure (SPP), and the Deviant Behavior Checklist.
Results: Statistical analyses showed that both self-esteem and parental attachment were not related to deviant behavior. However, when self-concept in domain specific was put into consideration, family self-concept was found to be negatively correlated with deviant behavior, whereas social self-concept was found to be positively correlated to deviant behavior. With respect to parental attachment, significant negative relation was found between the subscale of trust and deviant behavior. Among self-esteem, parental attachment, and peer influence, multiple regressions analyses indicated that peer influence was the best predictor of deviant behavior.
Discussion: The results have important implications for parents, teachers, social workers, and policy makers who are concerned with the problems associated with deviant behavior. Appropriate interventions focusing especially on peer influence may be set up to prevent deviant behavior.|
|Appears in Collections:||Applied Social Sciences - Postgraduate Diploma Papers - Psychology|
Items in CityU IR are protected by copyright, with all rights reserved, unless otherwise indicated.