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Please use this identifier to cite or link to this item: http://dspace.cityu.edu.hk/handle/2031/6658
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dc.contributor.authorYeung, Hin Leeen_US
dc.date.accessioned2012-08-27T00:46:55Z
dc.date.accessioned2017-09-19T09:12:50Z
dc.date.accessioned2019-02-12T07:30:33Z-
dc.date.available2012-08-27T00:46:55Z
dc.date.available2017-09-19T09:12:50Z
dc.date.available2019-02-12T07:30:33Z-
dc.date.issued2012en_US
dc.identifier.other2012eeyhl915en_US
dc.identifier.urihttp://144.214.8.231/handle/2031/6658-
dc.description.abstractThis project report presents the relationship between gate drive resistance, parasitic inductance, parasitic capacitance and the MOSFET. How the relationship can be effect the power loss and timing interval during switching period. Thus, an analytical method is applied in entire analysis both turn-on and turn-off transient. This analysis also divided each transient period into several stages. Each stage has corresponding equations such as gate source voltage, drain current and drain source voltage with timing. Finally, through this analysis an optimal gate drive resistance can be obtained based on those equations and the behavior. In this project, a 720W, 400V, 6A open loop buck converter hardware is built for compare with the analytical results. Finally, the result in both practical and theoretical would be well discussed and also a user interface program is built according those theoretical equations. Through this program people would get more familiar with the switching transient behavior with different parameters such stay inductance and capacitance.en_US
dc.rightsThis work is protected by copyright. Reproduction or distribution of the work in any format is prohibited without written permission of the copyright owner.en_US
dc.rightsAccess is restricted to CityU users.en_US
dc.titleStudy of the gate drive circuit for MOSFET in high power applicationsen_US
dc.contributor.departmentDepartment of Electronic Engineeringen_US
dc.description.supervisorSupervisor: Prof. Chung, Henry ; Assessor: Dr. Yeung, L Fen_US
Appears in Collections:Electrical Engineering - Undergraduate Final Year Projects 

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