Please use this identifier to cite or link to this item:
|Title:||XPS study on the effect of thermal annealing on the CeO2/La2O3 stacked gate dielectrics|
|Authors:||Zhang, Jieqiong (张洁琼)|
|Department:||Department of Electronic Engineering|
|Award:||Won the Young Scientist Award at 2015 IEEE TENCON.|
|Supervisor:||Prof. Wong, Hei|
|Appears in Collections:||Student Works With External Awards |
Files in This Item:
There are no files associated with this item.
Items in Digital CityU Collections are protected by copyright, with all rights reserved, unless otherwise indicated.