Skip navigation
Run Run Shaw Library City University of Hong KongRun Run Shaw Library

Please use this identifier to cite or link to this item: http://dspace.cityu.edu.hk/handle/2031/8190
Full metadata record
DC FieldValueLanguage
dc.contributor.authorZhang, Jieqiong (张洁琼)en_US
dc.date.accessioned2015-12-16T09:49:23Z
dc.date.accessioned2017-09-19T09:19:37Z
dc.date.accessioned2019-02-12T08:41:18Z-
dc.date.available2015-12-16T09:49:23Z
dc.date.available2017-09-19T09:19:37Z
dc.date.available2019-02-12T08:41:18Z-
dc.date.issued2015-11en_US
dc.identifier.otheree2015-005en_US
dc.identifier.urihttp://144.214.8.231/handle/2031/8190-
dc.titleXPS study on the effect of thermal annealing on the CeO2/La2O3 stacked gate dielectricsen_US
dc.typeResearch projecten_US
dc.contributor.departmentDepartment of Electronic Engineeringen_US
dc.description.awardWon the Young Scientist Award at 2015 IEEE TENCON.en_US
dc.description.supervisorProf. Wong, Heien_US
Appears in Collections:Student Works With External Awards 

Files in This Item:
There are no files associated with this item.
Show simple item record


Items in Digital CityU Collections are protected by copyright, with all rights reserved, unless otherwise indicated.

Send feedback to Library Systems
Privacy Policy | Copyright | Disclaimer