Please use this identifier to cite or link to this item:
http://dspace.cityu.edu.hk/handle/2031/8190| Title: | XPS study on the effect of thermal annealing on the CeO2/La2O3 stacked gate dielectrics |
| Authors: | Zhang, Jieqiong (张洁琼) |
| Department: | Department of Electronic Engineering |
| Issue Date: | Nov-2015 |
| Award: | Won the Young Scientist Award at 2015 IEEE TENCON. |
| Supervisor: | Prof. Wong, Hei |
| Type: | Research project |
| Appears in Collections: | Student Works With External Awards |
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